CPC Subgroup Additional Only
H01J 2237/26 Electron or ion microscopes
Full Title
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging > Electron or ion microscopes
8 direct subcodes
Child Classifications
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- H01J 2237/2602 Details
- H01J 2237/2611 Stereoscopic measurements and/or imaging
- H01J 2237/2614 Holography or phase contrast, phase related imaging in general, e.g. phase plates
- H01J 2237/2617 Comparison or superposition of transmission images; Moiré
- H01J 2237/262 Non-scanning techniques
- H01J 2237/28 Scanning microscopes
- H01J 2237/282 Determination of microscope properties
- H01J 2237/285 Emission microscopes
Top Applicants
Top 10 applicants by patent filingsfor class H01, 2013–2023, worldwide · Source: EPO PATSTAT
- SAMSUNG ELECTRONICS COMPANY KR 37,897
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY TW 36,116
- APPLIED MATERIALS US 21,640
- LG ENERGY SOLUTION KR 20,770
- LG CHEM KR 19,835
- TOKYO ELECTRON JP 18,519
- ROBERT BOSCH DE 14,595
- INTEL CORPORATION US 13,580
- MURATA MANUFACTURING COMPANY JP 12,151
- SAMSUNG SDI COMPANY KR 12,080