using incident electron beams, e.g. scanning electron microscopy [SEM]

Introduced: January 2018

Full Title

Full titles differ between systems:

IPC:

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or > by measuring secondary emission from the material > using electron or ion microprobes > using incident electron beams, e.g. scanning electron microscopy [SEM]

CPC:

Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 > by measuring secondary emission from the material > using electron or ion > using incident electron beams, e.g. scanning electron microscopy [SEM]

IPC and CPC are identically structured here. All 2 subcodes exist in both systems.

IPC defines codes here since 2018.

Child Classifications

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G01N 23/2252 Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA] since 2018 IPC+CPC Available in IPC and CPC
G01N 23/2254 Measuring cathodoluminescence since 2018 IPC+CPC Available in IPC and CPC