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PCE
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IPC Main Group
G01Q 10/00

Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe

Introduced: January 2010

Classification Context

Section:
PHYSICS
Class:
MEASURING; TESTING
Subclass:
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]

2 direct subcodes

Child Classifications

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