IPC Main Group
G01Q 20/00 Monitoring the movement or position of the probe
Introduced: January 2010
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
2 direct subcodes
Child Classifications
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- G01Q 20/02 by optical means
- G01Q 20/04 Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezoelectric gauge