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IPC Subgroup
G01Q 10/06

Circuits or algorithms therefor

Introduced: January 2010

Full Title

Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe > Fine scanning or positioning > Circuits or algorithms therefor

Classification Context

Section:
PHYSICS
Class:
MEASURING; TESTING
Subclass:
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]