Probe tip arrays

Full Title

General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group > Probe tip arrays

Classification Context

Section:

PHYSICS

Class:

MEASURING; TESTING

Subclass:

SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]