IPC Main Group
G01Q 70/00 General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group
Introduced: January 2010
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
4 direct subcodes
Child Classifications
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- G01Q 70/02 Probe holders
- G01Q 70/06 Probe tip arrays
- G01Q 70/08 Probe characteristics
- G01Q 70/16 Probe manufacture