Applications, other than SPM, of scanning-probe techniques

Classification Context

Section:

PHYSICS

Class:

MEASURING; TESTING

Subclass:

SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]

Scope Notes

Limiting references: Manufacture or treatment of microstructures Manufacture or treatment of nanostructures Recording or reproducing information using near-field interaction , ,