IPC Subgroup
G11C 29/14 Implementation of control logic, e.g. test mode decoders
Introduced: January 2006
Full Title
Checking stores for correct operation; Testing stores during standby or offline operation > Detection or location of defective memory elements > Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing > Built-in arrangements for testing, e.g. built-in self testing [BIST] > Implementation of control logic, e.g. test mode decoders
Classification Context
- Section:
- PHYSICS
- Class:
- INFORMATION STORAGE
- Subclass:
- STATIC STORES
1 direct subcode
Child Classifications
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- G11C 29/16 using microprogrammed units, e.g. state machines
Top Applicants
Top 10 applicants by patent filingsfor class G11, 2013–2023, worldwide · Source: EPO PATSTAT
- MICRON TECHNOLOGY US 10,574
- SK HYNIX KR 9,138
- SAMSUNG ELECTRONICS COMPANY KR 9,004
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY TW 3,739
- IBM (INTERNATIONAL BUSINESS MACHINES CORPORATION) US 3,443
- INTEL CORPORATION US 2,952
- SANDISK TECHNOLOGIES US 2,905
- WESTERN DIGITAL TECHNOLOGIES US 2,630
- TOSHIBA CORPORATION JP 2,593
- SEAGATE TECHNOLOGY US 2,472