IPC Subgroup
G01N 23/225 using electron or ion microprobes
Introduced: July 1974
Last revised: January 2018
Full Title
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or > by measuring secondary emission from the material > using electron or ion microprobes
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2 direct subcodes
Child Classifications
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- G01N 23/2251 using incident electron beams, e.g. scanning electron microscopy [SEM]
- G01N 23/2255 using incident ion beams, e.g. proton beams