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IPC Subgroup
G01Q 60/02

Multiple-type SPM, i.e. involving two or more SPM techniques

Introduced: January 2010

Full Title

Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof > Multiple-type SPM, i.e. involving two or more SPM techniques

Classification Context

Section:
PHYSICS
Class:
MEASURING; TESTING
Subclass:
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]

3 direct subcodes

Child Classifications

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  • G01Q 60/04 STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy]
  • G01Q 60/06 SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]
  • G01Q 60/08 MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy]