IPC Subgroup
G01Q 60/04 STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy]
Introduced: January 2010
Full Title
Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof > Multiple-type SPM, i.e. involving two or more SPM techniques > STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy]
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]