Conductive probes

Full Title

Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof > AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes > Probes, their manufacture or their related instrumentation, e.g. holders > Conductive probes

Classification Context

Section:

PHYSICS

Class:

MEASURING; TESTING

Subclass:

SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]