IPC Subgroup
G01Q 60/5 MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes
Introduced: January 2010
Full Title
Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof > MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
2 direct subcodes
Child Classifications
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- G01Q 60/52 Resonance
- G01Q 60/54 Probes, their manufacture or their related instrumentation, e.g. holders
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- SGCC(STATE GRID CORPORATION OF CHINA) 41,447
- CHINESE ACADEMY OF SCIENCES 32,952
- ROBERT BOSCH DE 16,470
- SAMSUNG ELECTRONICS COMPANY KR 10,052
- SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
- ZHEJIANG UNIVERSITY 9,529
- GUANGDONG POWER GRID CORPORATION 8,615
- TSINGHUA UNIVERSITY 7,805
- HALLIBURTON ENERGY SERVICES GROUP US 7,796
- QUALCOMM US 7,171