G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
Introduced: September 1968
Last revised: July 1974
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
Description
G01J encompasses instruments and methods for measuring physical properties of electromagnetic radiation in the infrared, visible, and ultraviolet wavelength ranges. The subclass covers intensity measurement, spectral analysis, polarization characteristics, phase determination, and temporal pulse properties of light, as well as colorimetric analysis and radiation pyrometry for non-contact temperature measurement. Applications include spectrophotometers, photometers, spectrographs, polarimeters, interferometers, and thermal imaging systems used in scientific research, manufacturing quality control, and materials characterization.
Filing statistics
IPC subclass G01J recorded 108,023 patent applications worldwide between 2013 and 2023. Annual filings grew from 6,425 in 2013 to 10,727 in 2023 (+67%), peaking at 15,333 applications in 2020. The most active applicants in class G01 are SGCC(STATE GRID CORPORATION OF CHINA) (41,447 applications), CHINESE ACADEMY OF SCIENCES (32,952 applications) and ROBERT BOSCH (16,470 applications).
Source: EPO PATSTAT, worldwide filings
In class comparison
G01J ranks 12th of 18 subclasses with filings in G01, with 108,023 applications between 2013 and 2023, 2.3% of the class. Annual filings grew 67% from 2013 to 2023, below the class as a whole (+138%).
| Rank | Subclass | Title | Applications | Share |
|---|---|---|---|---|
| 1 | G01N, Investigating or Analysing Materials by Determining Their Chemical or Physical Properties | Investigating or Analysing Materials by Determining Their Chemical or Physical Properties | 1,640,918 | 34.9% |
| 2 | G01R, Measuring Electric Variables; Measuring Magnetic Variables | Measuring Electric Variables; Measuring Magnetic Variables | 598,083 | 12.7% |
| 3 | G01B, Measuring Length, Thickness or Similar Linear Dimensions; Measuring Angles; Measuring Areas; Measuring Irregularities of Surfaces or Contours | Measuring Length, Thickness or Similar Linear Dimensions; Measuring Angles; Measuring Areas; Measuring Irregularities of Surfaces or Contours | 395,662 | 8.4% |
| 4 | G01S, Radio Direction-Finding; Radio Navigation; Determining Distance or Velocity by Use of Radio Waves; Locating or Presence-Detecting by Use of the Reflection or Reradiation of Radio Waves; Analogous Arrangements Using Other Waves | Radio Direction-Finding; Radio Navigation; Determining Distance or Velocity by Use of Radio Waves; Locating or Presence-Detecting by Use of the Reflection or Reradiation of Radio Waves; Analogous Arrangements Using Other Waves | 358,214 | 7.6% |
| 5 | G01M, Testing Static or Dynamic Balance of Machines or Structures; Testing of Structures or Apparatus, Not Otherwise Provided for | Testing Static or Dynamic Balance of Machines or Structures; Testing of Structures or Apparatus, Not Otherwise Provided for | 339,843 | 7.2% |
| 6 | G01C, Measuring Distances, Levels or Bearings; Surveying; Navigation; Gyroscopic Instruments; Photogrammetry or Videogrammetry | Measuring Distances, Levels or Bearings; Surveying; Navigation; Gyroscopic Instruments; Photogrammetry or Videogrammetry | 271,474 | 5.8% |
| 7 | G01D, Measuring Not Specially Adapted for a Specific Variable; Arrangements for Measuring Two or More Variables Not Covered by a Single Other Subclass; Tariff Metering Apparatus; Transferring or Transducing Arrangements Not Specially Adapted for a Specific Variable; Measuring or Testing Not Otherwise Provided for | Measuring Not Specially Adapted for a Specific Variable; Arrangements for Measuring Two or More Variables Not Covered by a Single Other Subclass; Tariff Metering Apparatus; Transferring or Transducing Arrangements Not Specially Adapted for a Specific Variable; Measuring or Testing Not Otherwise Provided for | 207,395 | 4.4% |
| 8 | G01F, Measuring Volume, Volume Flow, Mass Flow, or Liquid Level; Metering by Volume | Measuring Volume, Volume Flow, Mass Flow, or Liquid Level; Metering by Volume | 157,084 | 3.3% |
| 9 | G01L, Measuring Force, Stress, Torque, Work, Mechanical Power, Mechanical Efficiency, or Fluid Pressure | Measuring Force, Stress, Torque, Work, Mechanical Power, Mechanical Efficiency, or Fluid Pressure | 145,069 | 3.1% |
| 10 | G01K, Measuring Temperature; Measuring Quantity of Heat; Thermally-Sensitive Elements Not Otherwise Provided for | Measuring Temperature; Measuring Quantity of Heat; Thermally-Sensitive Elements Not Otherwise Provided for | 118,108 | 2.5% |
| 12 | G01J | Measurement of Intensity, Velocity, Spectral Content, Polarisation, Phase or Pulse Characteristics of Infrared, Visible or Ultraviolet Light; Colorimetry; Radiation Pyrometry | 108,023 | 2.3% |
Source: EPO PATSTAT, worldwide filings
Additional Content
Limiting references
Non-optical measurement of temperature Semiconductor devices sensitive to light , ,
Application references
Measuring length, thickness or similar linear dimensions by optical means; Instruments therefor , Investigating or analysing materials by optical means, e.g. by ellipsometry Prospecting or detecting by optical means Controlling or varying light intensity, spectral composition or exposure time in photographic printing apparatus Exposure in photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces
Related Keywords
7 direct subcodes
Child Classifications
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- G01J 1/00 Photometry, e.g. photographic exposure meter
- G01J 11/00 Measuring the characteristics of individual optical pulses or of optical pulse trains
- G01J 3/00 Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J 4/00 Measuring polarisation of light
- G01J 5/00 Radiation pyrometry, e.g. infrared or optical thermometry
- G01J 7/00 Measuring velocity of light
- G01J 9/00 Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
Top Applicants
Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT
- SGCC(STATE GRID CORPORATION OF CHINA) 41,447
- CHINESE ACADEMY OF SCIENCES 32,952
- ROBERT BOSCH DE 16,470
- SAMSUNG ELECTRONICS COMPANY KR 10,052
- SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
- ZHEJIANG UNIVERSITY 9,529
- GUANGDONG POWER GRID CORPORATION 8,615
- TSINGHUA UNIVERSITY 7,805
- HALLIBURTON ENERGY SERVICES GROUP US 7,796
- QUALCOMM US 7,171