IPC Main Group
G01Q 40/00 Calibration, e.g. of probes
Introduced: January 2010
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
1 direct subcode
Child Classifications
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- G01Q 40/02 Calibration standards or methods of fabrication thereof