IPC Subgroup
G01R 31/316 Testing of analog circuits
Introduced: January 1995
Last revised: January 2006
Full Title
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere > Testing of electronic circuits, e.g. by signal tracer > Testing of analog circuits
Classification Context
- Section:
- PHYSICS
- Class:
- MEASURING; TESTING
- Subclass:
- MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
2 direct subcodes
Child Classifications
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- G01R 31/3161 Marginal testing
- G01R 31/3163 Functional testing