Testing of combined analog and digital circuits

Introduced: January 1995

Last revised: January 2006

Full Title

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere > Testing of electronic circuits, e.g. by signal tracer > Testing of combined analog and digital circuits

Classification Context

Section:: PHYSICS
Class:: MEASURING; TESTING
Subclass:: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES