Testing of digital circuits

Introduced: January 1995

Last revised: January 2006

Full Title

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere > Testing of electronic circuits, e.g. by signal tracer > Testing of digital circuits

Classification Context

Section:: PHYSICS
Class:: MEASURING; TESTING
Subclass:: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES

3 direct subcodes

Child Classifications

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G01R 31/3173 Marginal testing
G01R 31/3177 Testing of logic operation, e.g. by logic analysers
G01R 31/3181 Functional testing