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IPC Subgroup
G01R 31/319

Tester hardware, i.e. output processing circuits

Introduced: January 1995

Last revised: January 2006

Full Title

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere > Testing of electronic circuits, e.g. by signal tracer > Testing of digital circuits > Functional testing > Tester hardware, i.e. output processing circuits

Classification Context

Section:
PHYSICS
Class:
MEASURING; TESTING
Subclass:
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES

1 direct subcode

Child Classifications

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  • G01R 31/3193 with comparison between actual response and known fault-free response

Top Applicants

Top 10 applicants by patent filingsfor class G01, 2013–2023, worldwide · Source: EPO PATSTAT

  1. SGCC(STATE GRID CORPORATION OF CHINA) 41,447
  2. CHINESE ACADEMY OF SCIENCES 32,952
  3. ROBERT BOSCH DE 16,470
  4. SAMSUNG ELECTRONICS COMPANY KR 10,052
  5. SINOPEC (CHINA PETROCHEMICAL CORPORATION) 9,573
  6. ZHEJIANG UNIVERSITY 9,529
  7. GUANGDONG POWER GRID CORPORATION 8,615
  8. TSINGHUA UNIVERSITY 7,805
  9. HALLIBURTON ENERGY SERVICES GROUP US 7,796
  10. QUALCOMM US 7,171