G03F 1/76 Patterning of masks by imaging
Introduced: January 2012
Full Title
Full titles differ between systems:
Originals for photomechanical production of textured or patterned surfaces, e.g. masks, photo-masks or reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof > Preparation processes not covered by groups > Patterning of masks by imaging
Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof > Preparation processes not covered by groups G03F1/20 - G03F1/50 > Patterning of masks by imaging
IPC and CPC are identically structured here. All 1 subcodes exist in both systems.
1 shared codes have differing titles between IPC and CPC.
IPC defines codes here since 2012.
Child Classifications
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- G03F 1/78 by charged particle beam [CPB], e.g. electron beam patterning of masks since 2012 IPC+CPC Available in IPC and CPC